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Specifications
Maximum scan speed of up to 50 frames/sec with 100 ¡Ñ100 nm2 scan range and 10 k pixels
Atomic defect resolution in closed-loop
Designed for medium to small sized cantilevers for lowest forces and highest scan speeds
Ultra-low noise cantilever-deflection detection system
IR cantilever-deflection detection light source with small spot size
Optional photothermal cantilever drive. 730 nm wavelength ensures minimal sample interaction compared to blue-light excitation
Highest detector bandwidth of 8 MHz for high speed signal capture
Automated laser and detector alignment
Scanner unit
2 ¡Ñ 2 ¡Ñ 1.5 £gm3 scan range
Sensor noise level < 0.09 nm RMS in xy
0.04 nm RMS sensor noise level in z
Highest resonance frequency for z axis of >180 kHz
Typical sample size 4 mm diameter
Control electronicsVortis 2 Speed controller: State-of-the-art, digital controller with lowest noise levels and highest flexibility
Newly designed, high-voltage power amplifier drives the scanner unit
New workflow-based V7 SPMControl softwareTrue multi-user platform, ideal for imaging facilities
User-programmable software
AutoAlignment and setup
Advanced feedback algorithms
Fully automated sensitivity and spring constant calibration using thermal noise or Sader method
Improved ForceWatch? and TipSaver? mode for force spectroscopy and imaging
Advanced spectroscopy modes, e.g. various force clamp modes or ramp designs
Powerful Data Processing (DP) with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section, etc.
Powerful batch processing of force curves and images, including WLC, FJC, step-fitting, JKR, DMT model and other analyses